✦ LIBER ✦
Physical characterization of hot-electron-induced MOSFET degradation through an improved approach to the charge-pumping technique
✍ Scribed by Bergonzoni, C.; Libera, G.D.
- Book ID
- 114534693
- Publisher
- IEEE
- Year
- 1992
- Tongue
- English
- Weight
- 666 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0018-9383
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