✦ LIBER ✦
The combined effects of deuterium anneals and deuterated barrier-nitride processing on hot-electron degradation in MOSFET's
✍ Scribed by Ference, T.G.; Burnham, J.S.; Clark, W.F.; Hook, T.B.; Mittl, S.W.; Watson, K.M.; Liang-Kai Kevin Han
- Book ID
- 114537679
- Publisher
- IEEE
- Year
- 1999
- Tongue
- English
- Weight
- 207 KB
- Volume
- 46
- Category
- Article
- ISSN
- 0018-9383
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