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Effect of dislocation source length on yield strength of nanostructured metallic multilayer thin films

✍ Scribed by Qizhen Li

Book ID: 118486271
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 319 KB
Volume: 493
Category: Article
ISSN: 0921-5093
DOI: 10.1016/j.msea.2007.07.098

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