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Contribution to size effect of yield strength from the stochastics of dislocation source lengths in finite samples

✍ Scribed by Triplicane A. Parthasarathy; Satish I. Rao; Dennis M. Dimiduk; Michael D. Uchic; Dallas R. Trinkle


Book ID
113896437
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
174 KB
Volume
56
Category
Article
ISSN
1359-6462

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