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Effect of anode material on high-field-induced hole current in SiO 2 layer of metal-oxide-semiconductor field-effect transistor

✍ Scribed by Xiaopinh Gao; Yee, S.S.


Book ID
114535904
Publisher
IEEE
Year
1994
Tongue
English
Weight
514 KB
Volume
41
Category
Article
ISSN
0018-9383

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