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Effect of annealing on the effective barrier height and ideality factor of nickel Schottky contacts to 4H-SiC

✍ Scribed by A. S. Potapov; P. A. Ivanov; T. P. Samsonova

Book ID: 111444325
Publisher: Springer
Year: 2009
Tongue: English
Weight: 179 KB
Volume: 43
Category: Article
ISSN: 1063-7826
DOI: 10.1134/s1063782609050145

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