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Effect of annealing on the conduction mechanism of n-type solar-grade polycrystalline silicon

โœ Scribed by Renuka Saxena; P. C. Mathur


Publisher
Springer
Year
1986
Tongue
English
Weight
328 KB
Volume
5
Category
Article
ISSN
0261-8028

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The effects of intragrain defects on the
โœ N. Inoue; C.W. Wilmsen; K.A. Jones ๐Ÿ“‚ Article ๐Ÿ“… 1981 ๐Ÿ› Elsevier Science โš– 962 KB

Intragrain defects in Wacker cast and Monsanto zone-refined polycrystalline silicon materials were investigated using the electron-beaminduced current (EBIC) technique. The EBIC response maps were compared with etch pit, local diffusion length and local photoresponse measurements. It was determined