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Effect of annealing on preferred orientations in the Cu/SiO2 and Cu/SiO2/Si(1 0 0) interfaces

✍ Scribed by S. Bagalagel; J. Shirokoff


Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
585 KB
Volume
479
Category
Article
ISSN
0921-5093

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