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Effect of indentation and annealing on 2 MeV Cu ion-implanted SiO2

✍ Scribed by Jin Pan; H. Wang; Y. Takeda; N. Umeda; K. Kono; H. Amekura; N. Kishimoto


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
408 KB
Volume
257
Category
Article
ISSN
0168-583X

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