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EBIST: a novel test generator with built-in fault detection capability

✍ Scribed by Pradhan, D.K.; Chunsheng Liu

Book ID: 117907371
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 354 KB
Volume: 24
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2005.850815

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