A Novel Delay Fault Testing Methodology Using Low-Overhead Built-In Delay Sensor

✍ Scribed by Swaroop Ghosh; Swarup Bhunia; Arijit Raychowdhury; Kaushik Roy

• Book ID: 117907743
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 428 KB
• Volume: 25
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2006.882523