Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique

✍ Scribed by Swarup Bhunia; Hamid Mahmoodi; Arijit Raychowdhury; Kaushik Roy

• Book ID: 106384398
• Publisher: Springer US
• Year: 2008
• Tongue: English
• Weight: 379 KB
• Volume: 24
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/s10836-008-5072-4