✦ LIBER ✦
A Low Overhead High Test Compression Technique Using Pattern Clustering With $n$-Detection Test Support
✍ Scribed by Seongmoon Wang; Wenlong Wei; Zhanglei Wang
- Book ID
- 118015397
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 809 KB
- Volume
- 18
- Category
- Article
- ISSN
- 1063-8210
No coin nor oath required. For personal study only.