✦ LIBER ✦
On generating tests that avoid the detection of redundant faults in synchronous sequential circuits with full scan
✍ Scribed by Pomeranz, I.; Reddy, S.M.
- Book ID
- 118697954
- Publisher
- IEEE
- Year
- 2006
- Tongue
- English
- Weight
- 1001 KB
- Volume
- 55
- Category
- Article
- ISSN
- 0018-9340
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