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Easy calibration method of vision system for in-situ measurement of strain of thin films

✍ Scribed by Jun-Hyub PARK; Dong-Joong KANG; Myung-Soo SHIN; Sung-Jo LIM; Son-Cheol YU; Kwang-Soo LEE; Jong-Eun HA; Sung-Hoon CHOA

No coin nor oath required. For personal study only.

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