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X-ray Monitoring System for in situ Investigation of Thin Film Growth

✍ Scribed by Dr. I. F. Mikhailov; V. I. Pinegin; V. V. Sleptzov; A. M. Baranov

Publisher
John Wiley and Sons
Year
1995
Tongue
English
Weight
343 KB
Volume
30
Category
Article
ISSN
0232-1300

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