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Dissociation kinetics of hydrogen-passivated (100) SiSiO2 interface defects

✍ Scribed by J.H. Stathis

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 198 KB
Volume: 28
Category: Article
ISSN: 0167-9317
DOI: 10.1016/0167-9317(95)00007-u

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