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Direct total-reflection X-ray fluorescence trace element analysis of organic matrix materials with a semiempirical standard

โœ Scribed by E.D. Greaves; G. Bernasconi; P. Wobrauschek; C. Streli

Book ID
114254485
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
529 KB
Volume
52
Category
Article
ISSN
0584-8547

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๐Ÿ“œ SIMILAR VOLUMES

Total reflection X-ray fluorescence: A t
Total reflection X-ray fluorescence: A technique for trace element analysis in materials
โœ N.L. Misra; K.D. Singh Mudher ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 614 KB

## Total Reflection X-ray Fluorescence (TXRF) is a variant of Energy dispersive X-ray Fluorescence (EDXRF). It is a comparatively new method of trace element analysis and finds its application in various research areas of material development and processing. The versatility of TXRF is due to (i.) r