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Direct observation of secondary ionization current in n-channel MOSFETs

✍ Scribed by Mihnea, A.; Rudeck, P.J.; Chun Chen; Prall, K.D.; Ghodsi, R.

Book ID: 114616913
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 379 KB
Volume: 49
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2002.805567

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