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Direct observation of defects in hexagonal boron nitride by near-edge X-ray absorption fine structure and X-ray photoemission spectroscopy

✍ Scribed by M. Petravic; R. Peter; L.-J. Fan; Y.-W. Yang; Y. Chen

Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 304 KB
Volume: 619
Category: Article
ISSN: 0168-9002
DOI: 10.1016/j.nima.2009.10.118

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