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Quantitative depth profiling of photoacid generators in photoresist materials by near-edge X-ray absorption fine structure spectroscopy

✍ Scribed by Vivek M. Prabhu; Sharadha Sambasivan; Daniel Fischer; Linda K. Sundberg; Robert D. Allen


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
571 KB
Volume
253
Category
Article
ISSN
0169-4332

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