Quantitative depth profiling of photoacid generators in photoresist materials by near-edge X-ray absorption fine structure spectroscopy
✍ Scribed by Vivek M. Prabhu; Sharadha Sambasivan; Daniel Fischer; Linda K. Sundberg; Robert D. Allen
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 571 KB
- Volume
- 253
- Category
- Article
- ISSN
- 0169-4332
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