Near Edge X-Ray Absorption Fine Structure Spectroscopy as a Tool to Probe Electronic and Structural Properties of Thin Organic Films and Liquids

✍ Scribed by Georg Haehner

• Publisher: John Wiley and Sons
• Year: 2007
• Weight: 11 KB
• Volume: 38
• Category: Article
• ISSN: 0931-7597
• DOI: 10.1002/chin.200714280