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Direct Observation of Crack Tip Geometry of SiO2 Glass by High-Resolution Electron Microscopy

✍ Scribed by Yoshio Bando; Setsuro Ito; Minoru Tomozawa

Book ID: 110820908
Publisher: John Wiley and Sons
Year: 2006
Tongue: English
Weight: 797 KB
Volume: 67
Category: Article
ISSN: 0002-7820
DOI: 10.1111/j.1151-2916.1984.tb19748.x

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