𝔖 Bobbio Scriptorium
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Comment on “Direct Observation of Crack-Tip Geometry of SiO2 Glass by High-Resolution Electron Microscopy”

✍ Scribed by Brian R. Lawn; David B. Marshall; Arthur H. Heuer


Book ID
110820767
Publisher
John Wiley and Sons
Year
1984
Tongue
English
Weight
146 KB
Volume
67
Category
Article
ISSN
0002-7820

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