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Comment on “Direct Observation of Crack-Tip Geometry of SiO2 Glass by High-Resolution Electron Microscopy”

✍ Scribed by Brian R. Lawn; David B. Marshall; Arthur H. Heuer

Book ID: 110820767
Publisher: John Wiley and Sons
Year: 1984
Tongue: English
Weight: 146 KB
Volume: 67
Category: Article
ISSN: 0002-7820
DOI: 10.1111/j.1151-2916.1984.tb19502.x

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