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Further Comment on “Direct Observation of Crack-Tip Geometry of SiO2 Glass by High-Resolution Electron Microscopy”

✍ Scribed by N. H. Macmillan

Book ID: 110823007
Publisher: John Wiley and Sons
Year: 1985
Tongue: English
Weight: 249 KB
Volume: 68
Category: Article
ISSN: 0002-7820
DOI: 10.1111/j.1151-2916.1985.tb11536.x

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