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Digital meter for silicon charge-carrier lifetime

โœ Scribed by A. I. Safronov


Publisher
Springer US
Year
1984
Tongue
English
Weight
287 KB
Volume
27
Category
Article
ISSN
0543-1972

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Easy-to-use surface passivation techniqu
โœ Jan Schmidt; Armin G. Aberle ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 155 KB

A novel, easily applicable surface passivation technique is presented, which, in combination with contactless photocoductance decay (PCD) measurements, allows a quick estimation of the bulk carrier lifetime of crystalline silicon wafers. The proposed passivation technique requires neither a chemical