𝔖 Bobbio Scriptorium

✦ LIBER ✦

Dielectric relaxation in thermally grown SiO2 films : P. J. Burkhardt. IEEE Transactions on Electron DevicesED-13, No. 12 (February 1966), p. 268

Book ID: 113190441
Publisher: Elsevier Science
Year: 1966
Tongue: English
Weight: 106 KB
Volume: 5
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(66)90200-9

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