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An investigation of instability and charge motion in metal-silicon oxide-silicon structures : S. R. Hofstein. IEEE Transactions on Electron DevicesED-13, No. 12 (February 1966), p. 222


Book ID
113190435
Publisher
Elsevier Science
Year
1966
Tongue
English
Weight
207 KB
Volume
5
Category
Article
ISSN
0026-2714

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