Influence of heat treatments and ionizing irradiations on the charge distribution and the number of surface states in the Si-SiO2 system : E. Kooi. IEEE Transactions on Electron DevicesED-13, No. 12 (February 1966), p. 238

• Book ID: 113190436
• Publisher: Elsevier Science
• Year: 1966
• Tongue: English
• Weight: 106 KB
• Volume: 5
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(66)90195-8