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Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test

โœ Scribed by Jin-Fu Li; Ruey-Shing Tzeng; Cheng-Wen Wu

Book ID
110349763
Publisher
Springer US
Year
2002
Tongue
English
Weight
743 KB
Volume
18
Category
Article
ISSN
0923-8174

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๐Ÿ“œ SIMILAR VOLUMES

[IEEE Computer Soc Proceedings. 18th Int
[IEEE Computer Soc Proceedings. 18th International Conference on VLSI Design - Kolkata, India (3-7 Jan. 2005)] 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design - Heterogeneous and multi-level compression techniques for test volume reduction in systems-on-chip
โœ Lingapan, L.; Ravi, S.; Raghunathan, A.; Jha, N.K.; Chakradhar, S.T. ๐Ÿ“‚ Article ๐Ÿ“… 2005 ๐Ÿ› IEEE Computer Soc ๐ŸŒ English โš– 256 KB

A January 2005 conference fostered interaction between the domains of system architecture, logic and circuit design, and device fabrication. Design automation, embedded systems design, rapid prototyping, and embedded software design were some other themes. Papers from the conference focus on power-a