A parallel built-in self-diagnostic method for nontraditional faults of embedded memory arrays

✍ Scribed by Arora, V.; Jone, W.B.; Huang, D.C.; Das, S.R.

• Book ID: 114629628
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 475 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2004.830785