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A built-in self-testing method for embedded multiport memory arrays

✍ Scribed by Narayanan, V.; Ghosh, S.; Jone, W.-B.; Das, S.R.

Book ID
114630001
Publisher
IEEE
Year
2005
Tongue
English
Weight
637 KB
Volume
54
Category
Article
ISSN
0018-9456

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## Abstract The self‐test of built‐in RAMs is an excellent method to simplify the testing of VLSI. This paper considers the built‐in self‐test using the linear feedback shift registers on the pseudorandom input generator and the output signature analyzer. It is demonstrated that the method is usefu