Diagnosis of leakage faults withIDDQ

✍ Scribed by Robert C. Aitken

• Book ID: 104635846
• Publisher: Springer US
• Year: 1992
• Tongue: English
• Weight: 844 KB
• Volume: 3
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/bf00135340

✦ Synopsis

Recently there has been renewed interest in fault detection in static CMOS circuits through IDD Q monitoring. This work shows that, in addition to fault detection, accurate fault diagnosis may be performed using a combination of current and voltage observations. The proposed system combines a simple single fault model for test generation with a more realistic multiple defect model for diagnosis, and as a result requires only minor modifications to existing stuck-at fault ATPG software. The associated hardware is sufficiently simple that on-board implementation is possible. Experimental results demonstrate the effectiveness of the method on a standard-cell ASIC.