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Wafer-scale diagnosis tolerating comparator faults

✍ Scribed by Sallay, B.; Maestrini, P.; Santi, P.

Book ID: 114448383
Publisher: The Institution of Electrical Engineers
Year: 1999
Tongue: English
Weight: 519 KB
Volume: 146
Category: Article
ISSN: 1350-2387
DOI: 10.1049/ip-cdt:19990438

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