Algorithms forIDDQmeasurement based diagnosis of bridging faults

✍ Scribed by Sreejit Chakravarty; Minsheng Liu

• Book ID: 104635847
• Publisher: Springer US
• Year: 1992
• Tongue: English
• Weight: 716 KB
• Volume: 3
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/bf00135341

✦ Synopsis

In the absence of information about the layout one is left with no alternative but to consider all bridging faults. An algorithm for diagnosis of a subset of such faults, viz. single two line bridging faults in static CMOS combinational circuits is presented. This algorithm uses results from IDD Q measurement based testing.

Unlike known diagnosis algorithms, this algorithm does not use fault dictionaries, it uses only logic simulation and uses no fault simulation. It also uses SOPS, a novel representation of subsets of two-line bridging faults resulting in an efficient algorithm.

In spite of the large number of faults that we consider, our experimental results point to the computational feasibility of IDD Q Measurement based diagnosis of single two line bridging faults. It also shows the effectiveness of reducing the set of possible faults using IDD Q measurements.