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Devices’ optimization against hot-carrier degradation in high voltage pLEDMOS transistor

✍ Scribed by Hong Wu; Qinsong Qian; Siyang Liu; Weifeng Sun; Longxing Shi

Book ID
104058104
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
683 KB
Volume
50
Category
Article
ISSN
0026-2714

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