Mechanisms of Hot-Carrier-Induced Threshold-Voltage Shift in High-Voltage p-Type LDMOS Transistors

✍ Scribed by Chen, J.F.; Kuen-Shiuan Tian; Shiang-Yu Chen; Kuo-Ming Wu; Shih, J.R.; Wu, K.

• Book ID: 114619757
• Publisher: IEEE
• Year: 2009
• Tongue: English
• Weight: 458 KB
• Volume: 56
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2009.2030442