✦ LIBER ✦
Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage
✍ Scribed by D. Corso; S. Aurite; E. Sciacca; D. Naso; S. Lombardo; A. Santangelo; M.C. Nicotra; S. Cascino
- Book ID
- 108210681
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 748 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0026-2714
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