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Determination of Thickness, Dielectric Constant of Thiol Films, and Kinetics of Adsorption Using Surface Plasmon Resonance

✍ Scribed by Damos, Flavio S.; Luz, Rita C. S.; Kubota, Lauro T.

Book ID: 120319723
Publisher: American Chemical Society
Year: 2005
Tongue: English
Weight: 211 KB
Volume: 21
Category: Article
ISSN: 0743-7463
DOI: 10.1021/la0487038

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