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Precise determination of the dielectric constant and thickness of a nanolayer by use of surface plasmon resonance sensing and multiexperiment linear data analysis

✍ Scribed by Chyou, Jin-Jung ;Chu, Chih-Sheng ;Chien, Fan-Ching ;Lin, Chun-Yu ;Yeh, Tse-Liang ;Hsu, Roy Chaoming ;Chen, Shean-Jen

No coin nor oath required. For personal study only.

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