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Determination of the valence band offset of Si/Si0.7Ge0.3/Si quantum wells using deep level transient spectroscopy

✍ Scribed by Vescan, L.; Apetz, R.; Lüth, H.

Book ID: 121758693
Publisher: American Institute of Physics
Year: 1993
Tongue: English
Weight: 590 KB
Volume: 73
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.353984

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