Determination of conduction band offset between strained CdSe and ZnSe layers using deep level transient spectroscopy

✍ Scribed by Rangel-Kuoppa, Victor-Tapio

• Book ID: 121830621
• Publisher: American Institute of Physics
• Year: 2012
• Tongue: English
• Weight: 815 KB
• Volume: 100
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.4729764