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Determination of the tilt and twist angles of curved GaN layers by high-resolution x-ray diffraction

✍ Scribed by Liu, J Q; Wang, J F; Qiu, Y X; Guo, X; Huang, K; Zhang, Y M; Hu, X J; Xu, Y; Xu, K; Huang, X H; Yang, H

No coin nor oath required. For personal study only.

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