Determination of the tilt and twist angl
Determination of the tilt and twist angles of curved GaN layers by high-resolution x-ray diffraction
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Liu, J Q; Wang, J F; Qiu, Y X; Guo, X; Huang, K; Zhang, Y M; Hu, X J; Xu, Y; Xu,
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Article
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2009
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Institute of Physics
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English
โ 386 KB