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Determination of the thickness and optical constants of amorphous silicon

✍ Scribed by Swanepoel, R

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Combined processing of ellipsometric and

✍ R. V. Aleshkin; S. M. Karabanov; D. I. Ponomarev 📂 Article 📅 1994 🏛 Springer US 🌐 English ⚖ 304 KB

Determination of thickness and optical c

✍ Mulato, M.; Chambouleyron, I.; Birgin, E. G.; MartÄ±Ìnez, J. M. 📂 Article 📅 2000 🏛 American Institute of Physics 🌐 English ⚖ 236 KB

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✍ T. Pisarkiewicz; A. Czapla; H. Czternastek 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 230 KB

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✍ Chambouleyron, I.; Ventura, S. D.; Birgin, E. G.; MartiÌnez, J. M. 📂 Article 📅 2002 🏛 American Institute of Physics 🌐 English ⚖ 392 KB

Determination of surface roughness and o

✍ Swanepoel, R 📂 Article 📅 1984 🏛 Institute of Physics ⚖ 732 KB