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Determination of thickness and optical constants of amorphous silicon films from transmittance data

✍ Scribed by Mulato, M.; Chambouleyron, I.; Birgin, E. G.; MartÄ±Ìnez, J. M.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

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✍ Swanepoel, R 📂 Article 📅 1983 🏛 Institute of Physics ⚖ 673 KB

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