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Determination of the parameters of multilayer nanostructures using two-wave X-ray reflectometry

✍ Scribed by N. L. Popov; Yu. A. Uspenskii; A. G. Turyanskii; I. V. Pirshin; A. V. Vinogradov; Yu. Ya. Platonov

No coin nor oath required. For personal study only.

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