✦ LIBER ✦
Anomalous dispersion X-ray reflectometry for model-independent determination of Al/C multilayer structures
✍ Scribed by T. Ohkawa; Y. Yamaguchi; O. Sakata; M.K. Sanyal; A. Datta; S. Banerjee; H. Hashizume
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 286 KB
- Volume
- 221
- Category
- Article
- ISSN
- 0921-4526
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