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Determination of the deviations in multilayers from X-ray diffraction profiles

✍ Scribed by X.C. He; H.S. Shen; X.Y. Yuan; Z.Q. Wu

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 166 KB
Volume: 308
Category: Article
ISSN: 0168-9002
DOI: 10.1016/0168-9002(91)90673-e

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