The possibilities and limits of the polynomial approximation for an accurate determination of the peak position of X-ray diffraction profiles in precision lattice parameter measurements according to the BOND-method are investigated. The use of a polynomial approximation with reciprocal measuring val
Determination of the bending radius and diffraction profile parameters for X-Ray Analyzer Crystals with X-ray parallel beam
✍ Scribed by M. T. Kogan; V. M. Shechtman
- Publisher
- John Wiley and Sons
- Year
- 1984
- Tongue
- English
- Weight
- 361 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0232-1300
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